New optical analysis method for components
Centre National d'Etudes Spatiales CNES - 10/17/2016
This invention relates to electro-optical analysis of electronic components. The re ected signal, obtained by optical stimulation, of the part of the targeted component is recovered for analysis. The acquisition is fast and can be used without prior knowledge of noise parameters.
Economical - Improved quality, time savings. Fast implementation - Use of a generic manufacturing process. - Programmable and adaptable to existing tools.
Performance enhancements - Optimized integrated circuits analysis. - Search of the signal more ef cient and quicker. - Construction and improvement of the useful signal quality. - Noise can be unknown. Programmable - Programmable device. - Compatible with standard equipment.